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MCC
  omponents
21201 Itasca Street Chatsworth

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Features
Wide Voltage Range Available
Glass Package
High Temp Soldering: 250°C for 10 Seconds At Terminals
1N5221
THRU
1N5281
500 mW
Zener Diode
2.4 to 200 Volts
Maximum Ratings
Operating Temperature: -55°C to +150°C
Storage Temperature: -55°C to +150°C
500 mWatt DC Power Dissipation
Power Derating: 4.0mW/°C above 50°C
Forward Voltage @ 200mA: 1.1 Volts
Figure 1 - Typical Capacitance
100
pf 10
At zero volts
At –2 Volts VR
1
0
100
VZ
200
Typical Capacitance (pf) – versus – Zener voltage (VZ)
Figure 2 - Derating Curve
400
mW
200
0 50 100 150
Temperature °C
Power Dissipation (mW) - Versus - Temperature °C
DO-35
D
A
D
Cathode
Mark
B
C
DIMENSIONS
INCHES
MM
DIM
MIN
MAX
MIN
MAX
A --- .166 ---
4.2
B --- .079 ---
2.00
C --- .020 ---
.52
D 1.000 --- 25.40
---
NOTE
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1N5221 thru 1N5281
MCC
ELECTRICAL CHARACTERISTICS @25°C
MCC
NOMINAL ZENER
TEST
MAXIMUM ZENER IMPEDANCE
MAXIMUM REVERSE
MAX. ZENER VOLTAGE
PART
NUMBER
VOLTAGE VZ @ IZT
VOLTS
CURRENT IZT
mA
‘B’ SUFFIX ONLY
ZZT @ IZT
ZZK @IZK = 0.25mA
OHMS
OHMS
LEAKAGE CURRENT
IR @ VR
µA VOLTS
TEMP COEFFICIENT ‘B’
SUFFIX ONLY
% / °C
1N5221
2.4
20 30
1200
100 1.0
-0.085
1N5222
2.5
20 30
1250
100 1.0
-0.085
1N5223
2.7
20 30
1300
75 1.0
-0.080
1N5224
2.8
20 30
1400
75 1.0
-0.080
1N5225
3.0
20 29
1600
50 1.0
-0.075
1N5226
3.3
20 28
1600
25 1.0
-0.070
1N5227
3.6
20 24
1700
15 1.0
-0.065
1N5228
3.9
20 23
1900
10 1.0
-0.060
1N5229
1N5230
1N5231
1N5232
4.3
4.7
5.1
5.6
20 22
20 19
20 17
20 11
2000
1900
1600
1600
5.0 1.0
5.0 2.0
5.0 2.0
5.0 3.0
±0.055
±0.030
±0.030
+0.038
1N5233
6.0
20 7.0
1600
5.0 3.5
+0.038
1N5234
6.2
20 7.0
1000
5.0 4.0
+0.045
1N5235
6.8
20 5.0
750 3.0 5.0
+0.050
1N5236
7.5
20 6.0
500 3.0 6.0
+0.058
1N5237
8.2
20 8.0
500 3.0 6.5
+0.062
1N5238
8.7
20 8.0
600 3.0 6.5
+0.065
1N5239
9.1
20 10
600 3.0 7.0
+0.068
1N5240
10
20 17
600 3.0 8.0
+0.075
1N5241
11
20 22
600 2.0 8.4
+0.076
1N5242
12
20 30
600 1.0 9.1
+0.077
1N5243
13
9.5 13
600 0.5 9.9
+0.079
1N5244
14
9.0 15
600 0.1 10
+0.082
1N5245
15
8.5 16
600 0.1 11
+0.082
1N5246
16
7.8 17
600 0.1 12
+0.083
1N5247
17
7.4 19
600 0.1 13
+0.084
1N5248
18
7.0 21
600 0.1 14
+0.085
1N5249
19
6.6 23
600 0.1 14
+0.086
1N5250
20
6.2 25
600 0.1 15
+0.086
1N5251
22
5.6 29
600 0.1 17
+0.087
1N5252
24
5.2 33
600 0.1 18
+0.088
1N5253
25
5.0 35
600 0.1 19
+0.089
1N5254
27
4.6 41
600 0.1 21
+0.090
1N5255
28
4.5 44
600 0.1 21
+0.091
1N5256
30
4.2 49
600 0.1 23
+0.091
1N5257
33
3.8 58
700 0.1 25
+0.092
1N5258
36
3.4 70
700 0.1 27
+0.093
1N5259
39
3.2 80
800 0.1 30
+0.094
1N5260
43
3.0 93
900 0.1 33
+0.095
1N5261
47
2.7 105
1000
0.1 36
+0.095
1N5262
51
2.5 125
1100
0.1 39
+0.096
1N5263
56
2.2 150
1300
0.1 43
+0.096
1N5264
60
2.1 170
1400
0.1 46
+0.097
1N5265
62
2.0 185
1400
0.1 47
+0.097
1N5266
68
1.8 230
1600
0.1 52
+0.097
1N5267
75
1.7 270
1700
0.1 56
+0.098
1N5268
82
1.5 330
2000
0.1 62
+0.098
1N5269
87
1.4 370
2200
0.1 68
+0.099
1N5270
91
1.4 400
2300
0.1 69
+0.099
1N5271
100
1.3 500
2600
0.1 76
+0.110
1N5272
110
1.1 750
3000
0.1 84
+0.110
1N5273
120
1.0 900
4000
0.1 91
+0.110
1N5274
130
0.95
1100
4500
0.1 99
+0.110
1N5275
140
0.90
1300
4500
0.1 106
+0.110
1N5276
150
0.85
1500
5000
0.1 114
+0.110
1N5277
160
0.80 1700
5500
0.1 122
+0.110
1N5278
170
0.74 1900
5500
0.1 129
+0.110
1N5279
180
0.68 2200
6000
0.1 137
+0.110
1N5280
190
0.66
2400
6500
0.1 144
+0.110
1N5281
200
0.65
2500
7000
0.1 152
+0.110
NOTE 1: Table as shown lists type numbers, which indicate a tolerance of ±20% with guaranteed limits on only Vz, IR, and VF. Devices with
guaranteed limits on all six parameters are indicated by suffix “A” for ±10%, “B” for ±5%, “C” for ±2%, and “D” for ±1% tolerance
NOTE 2: The electrical characteristics are measured after allowing the device to stabilize for 20 seconds.
NOTE 3: Temperature coefficient (áVZ). Test conditions for temperature coefficient are as follows:
a. IZT = 7.5mA, TI = 25oC T2 = 125oC (1N5221 thru 1N5242)
b. IZT = Rated IZT, TI = 25oC, T2 = 125oC (1N5243 thru 1N5281)
Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature.
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