DL5252.pdf 데이터시트 (총 2 페이지) - 파일 다운로드 DL5252 데이타시트 다운로드

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MCC
  omponents
21201 Itasca Street Chatsworth

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Features
Wide Voltage Range Available
Glass Package
High Temp Soldering: 250°C for 10 Seconds At Terminals
Surface Mount Package
DL5221
THRU
DL5281
500 mW
Zener Diode
2.4 to 200 Volts
Maximum Ratings
Operating Temperature: -55°C to +150°C
Storage Temperature: -55°C to +150°C
500 mWatt DC Power Dissipation
Power Derating: 4.0mW/°C above 50°C
Forward Voltage @ 200mA: 1.1 Volts
Figure 1 - Typical Capacitance
100
pf 10
At zero volts
At –2 Volts VR
1
0
100
VZ
200
Typical Capacitance (pf) – versus – Zener voltage (VZ)
Figure 2 - Derating Curve
400
mW
200
0 50 100 150
Temperature °C
Power Dissipation (mW) - Versus - Temperature °C
MINIMELF
Cathode Mark
C
B
A
DIMENSIONS
INCHES
DIM MIN
MAX
A .134 .142
B .008 .016
C .055 .059
MM
MIN
3.40
.20
1.40
MAX
3.60
.40
1.50
NOTE
SUGGESTED SOLDER
PAD LAYOUT
0.105
0.075”
0.030”
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DL5221 thru DL5281
MCC
MCC
PART
NUMBER
NOMINAL ZENER
VOLTAGE VZ @ IZT
VOLTS
TEST
CURRENT IZT
mA
MAXIMUM ZENER IMPEDANCE
‘B’ SUFFIX ONLY
ZZT @ IZT
ZZK @IZK = 0.25mA
OHMS
OHMS
MAXIMUM REVERSE
LEAKAGE CURRENT
IR @ VR
µA VOLTS
MAX. ZENER VOLTAGE
TEMP COEFFICIENT ‘B’
SUFFIX ONLY
% / °C
DL5221
DL5222
DL5223
DL5224
DL5225
DL5226
DL5227
DL5228
DL5229
DL5230
DL5231
DL5232
DL5233
DL5234
DL5235
DL5236
DL5237
DL5238
DL5239
DL5240
DL5241
DL5242
DL5243
DL5244
DL5245
DL5246
DL5247
DL5248
DL5249
DL5250
DL5251
DL5252
DL5253
DL5254
DL5255
DL5256
DL5257
DL5258
DL5259
DL5260
DL5261
DL5262
DL5263
DL5264
DL5265
DL5266
DL5267
DL5268
DL5269
DL5270
DL5271
DL5272
DL5273
DL5274
DL5275
DL5276
DL5277
DL5278
DL5279
DL5280
DL5281
2.4
20 30
1200
100 1.0
-0.085
2.5
20 30
1250
100 1.0
-0.085
2.7
20 30
1300
75 1.0
-0.080
2.8
20 30
1400
75 1.0
-0.080
3.0
20 29
1600
50 1.0
-0.075
3.3
20 28
1600
25 1.0
-0.070
3.6
20 24
1700
15 1.0
-0.065
3.9
20 23
1900
10 1.0
-0.060
4.3
20 22
2000
5.0 1.0
±0.055
4.7
20 19
1900
5.0 2.0
±0.030
5.1
20 17
1600
5.0 2.0
±0.030
5.6
20 11
1600
5.0 3.0
+0.038
6.0
20 7.0
1600
5.0 3.5
+0.038
6.2
20 7.0
1000
5.0 4.0
+0.045
6.8
20 5.0
750 3.0 5.0
+0.050
7.5
20 6.0
500 3.0 6.0
+0.058
8.2
20 8.0
500 3.0 6.5
+0.062
8.7
20 8.0
600 3.0 6.5
+0.065
9.1
20 10
600 3.0 7.0
+0.068
10
20 17
600 3.0 8.0
+0.075
11
20 22
600 2.0 8.4
+0.076
12
20 30
600 1.0 9.1
+0.077
13
9.5 13
600 0.5 9.9
+0.079
14
9.0 15
600 0.1 10
+0.082
15
8.5 16
600 0.1 11
+0.082
16
7.8 17
600 0.1 12
+0.083
17
7.4 19
600 0.1 13
+0.084
18
7.0 21
600 0.1 14
+0.085
19
6.6 23
600 0.1 14
+0.086
20
6.2 25
600 0.1 15
+0.086
22
5.6 29
600 0.1 17
+0.087
24
5.2 33
600 0.1 18
+0.088
25
5.0 35
600 0.1 19
+0.089
27
4.6 41
600 0.1 21
+0.090
28
4.5 44
600 0.1 21
+0.091
30
4.2 49
600 0.1 23
+0.091
33
3.8 58
700 0.1 25
+0.092
36
3.4 70
700 0.1 27
+0.093
39
3.2 80
800 0.1 30
+0.094
43
3.0 93
900 0.1 33
+0.095
47
2.7 105
1000
0.1 36
+0.095
51
2.5 125
1100
0.1 39
+0.096
56
2.2 150
1300
0.1 43
+0.096
60
2.1 170
1400
0.1 46
+0.097
62
2.0 185
1400
0.1 47
+0.097
68
1.8 230
1600
0.1 52
+0.097
75
1.7 270
1700
0.1 56
+0.098
82
1.5 330
2000
0.1 62
+0.098
87
1.4 370
2200
0.1 68
+0.099
91
1.4 400
2300
0.1 69
+0.099
100
1.3 500
2600
0.1 76
+0.110
110
1.1 750
3000
0.1 84
+0.110
120
1.0 900
4000
0.1 91
+0.110
130
0.95
1100
4500
0.1 99
+0.110
140
0.90
1300
4500
0.1 106
+0.110
150
0.85
1500
5000
0.1 114
+0.110
160
0.80
1700
5500
0.1 122
+0.110
170
0.74
1900
5500
0.1 129
+0.110
180
0.68
2200
6000
0.1 137
+0.110
190
0.66
2400
6500
0.1 144
+0.110
200
0.65
2500
7000
0.1 152
+0.110
NOTE 1: Table as shown lists type numbers, which indicate a tolerance of ±20% with guaranteed limits on only Vz, IR, and VF. Devices with
guaranteed limits on all six parameters are indicated by suffix “A” for ±10%, “B” for ±5%, “C” for ±2%, and “D” for ±1% tolerance
NOTE 2: The electrical characteristics are measured after allowing the device to stabilize for 20 seconds.
NOTE 3: Temperature coefficient (áVZ). Test conditions for temperature coefficient are as follows:
a. IZT = 7.5mA, TI = 25oC T2 = 125oC (DL5221 thru DL5242)
b. IZT = Rated IZT, TI = 25oC, T2 = 125oC (DL5243 thru DL5281)
Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature.
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