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25AA160A/B, 25LC160A/B
16K SPI Bus Serial EEPROM
Device Selection Table
Part Number
VCC Range
25LC160A
25AA160A
25LC160B
25AA160B
2.5-5.5V
1.8-5.5V
2.5-5.5V
1.8-5.5V
Page Size
16 Byte
16 Byte
32 Byte
32 Byte
Temp. Ranges
I,E
I
I,E
I
Packages
P, SN, ST, MS
P, SN, ST, MS
P, SN, ST, MS
P, SN, ST, MS
Features:
• Max. Clock 10 MHz
• Low-Power CMOS Technology
• 2048 x 8-bit Organization
• 16-Byte Page (‘A’ version devices)
• 32-Byte Page (‘B’ version devices)
• Write Cycle Time: 5 ms max.
• Self-Timed Erase and Write Cycles
• Block Write Protection:
- Protect none, 1/4, 1/2 or all of array
• Built-In Write Protection:
- Power-on/off data protection circuitry
- Write enable latch
- Write-protect pin
• Sequential Read
• High Reliability:
- Endurance: 1,000,000 erase/write cycles
- Data retention: > 200 years
- ESD protection: > 4000V
• Temperature Ranges Supported:
- Industrial (I):
- Automotive (E):
-40°C to +85°C
-40°C to +125°C
• Pb-Free and RoHS Compliant
Pin Function Table
Name
Function
CS Chip Select Input
SO Serial Data Output
WP Write-Protect
VSS Ground
SI Serial Data Input
SCK
HOLD
VCC
Serial Clock Input
Hold Input
Supply Voltage
Description:
The Microchip Technology Inc. 25AA160A/B,
25LC160A/B (25XX160A/B*) are 16 Kbit Serial
Electrically Erasable PROMs. The memory is accessed
via a simple Serial Peripheral Interface (SPI)
compatible serial bus. The bus signals required are a
clock input (SCK) plus separate data in (SI) and data
out (SO) lines. Access to the device is controlled
through a Chip Select (CS) input.
Communication to the device can be paused via the
hold pin (HOLD). While the device is paused, transi-
tions on its inputs will be ignored, with the exception of
Chip Select, allowing the host to service higher priority
interrupts.
The 25XX160A/B is available in standard Pb-free pack-
ages including 8-lead PDIP and SOIC, and advanced
packaging including 8-lead MSOP, and 8-lead TSSOP.
Package Types (not to scale)
TSSOP/MSOP
(ST, MS)
CS 1
SO 2
WP
VSS
3
4
8 VCC
7
6
5
HOLD
SCK
SI
PDIP/SOIC
(P, SN)
CS 1
SO 2
WP 3
VSS 4
8 VCC
7 HOLD
6 SCK
5 SI
*25XX160A/B is used in this document as a generic part
number for the 25AA160A/B, 25LC160A/B devices.
© 2007 Microchip Technology Inc.
DS21807D-page 1

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25XX160A/B
1.0 ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings(†)
VCC.............................................................................................................................................................................7.0V
All inputs and outputs w.r.t. VSS ......................................................................................................... -0.6V to VCC +1.0V
Storage temperature .................................................................................................................................-65°C to 150°C
Ambient temperature under bias ...............................................................................................................-40°C to 125°C
ESD protection on all pins ..........................................................................................................................................4 kV
NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an
extended period of time may affect device reliability.
TABLE 1-1: DC CHARACTERISTICS
DC CHARACTERISTICS
Industrial (I):
Automotive (E):
TAMB = -40°C to +85°C VCC = 1.8V to 5.5V
TAMB = -40°C to +125°C VCC = 2.5V to 5.5V
Param.
No.
Sym.
Characteristic
D001
D002
D003
D004
D005
D006
D007
VIH1
VIH2
VIL1
VIL2
VOL
VOL
VOH
D008
D009
ILI
ILO
D010 CINT
High-level input
voltage
Low-level input
voltage
Low-level output
voltage
High-level output
voltage
Input leakage current
Output leakage
current
Internal Capacitance
(all inputs and
outputs)
D011 ICC Read
Min.
2.0
0.7 VCC
-0.3
-0.3
VCC -0.5
Operating Current
Max.
VCC +1
VCC +1
0.8
0.2 VCC
0.4
0.2
±1
±1
7
6
2.5
Units
V
V
V
V
V
V
V
μA
μA
pF
mA
mA
D012 ICC Write
— 3 mA
D013 ICCS
— 5 μA
Standby Current
— 1 μA
Note: This parameter is periodically sampled and not 100% tested.
Test Conditions
VCC 2.7V (Note)
VCC < 2.7V (Note)
VCC 2.7V (Note)
VCC < 2.7V (Note)
IOL = 2.1 mA
IOL = 1.0 mA, VCC < 2.5V
IOH = -400 μA
CS = VCC, VIN = VSS TO VCC
CS = VCC, VOUT = VSS TO VCC
TAMB = 25°C, CLK = 1.0 MHz,
VCC = 5.0V (Note)
VCC = 5.5V; FCLK = 10.0 MHz;
SO = Open
VCC = 2.5V; FCLK = 5.0 MHz;
SO = Open
VCC = 5.5V
CS = VCC = 5.5V, Inputs tied to VCC or
VSS, TAMB = -40°C TO +125°C
CS = VCC = 2.5V, Inputs tied to VCC or
VSS, TAMB = -40°C TO +85°C
DS21807D-page 2
© 2007 Microchip Technology Inc.

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25XX160A/B
TABLE 1-2: AC CHARACTERISTICS
AC CHARACTERISTICS
Industrial (I): TAMB = -40°C to +85°C VCC = 1.8V to 5.5V
Automotive (E): TAMB = -40°C to +125°C VCC = 2.5V to 5.5V
Param.
No.
Sym.
Characteristic
Min.
Max. Units
Test Conditions
1 FCLK Clock Frequency
— 10 MHz 4.5V VCC 5.5V
— 5 MHz 2.5V VCC < 4.5V
— 3 MHz 1.8V VCC < 2.5V
2 TCSS CS Setup Time
50 — ns 4.5V VCC 5.5V
100 — ns 2.5V VCC < 4.5V
150 — ns 1.8V VCC < 2.5V
3 TCSH CS Hold Time
100 — ns 4.5V VCC 5.5V
200 — ns 2.5V VCC < 4.5V
250 — ns 1.8V VCC < 2.5V
4 TCSD CS Disable Time
50 — ns —
5 Tsu Data Setup Time
10 — ns 4.5V VCC 5.5V
20 — ns 2.5V VCC < 4.5V
30 — ns 1.8V VCC < 2.5V
6 THD Data Hold Time
20 — ns 4.5V VCC 5.5V
40 — ns 2.5V VCC < 4.5V
50 — ns 1.8V VCC < 2.5V
7 TR CLK Rise Time
— 500 ns (Note 1)
8 TF CLK Fall Time
— 500 ns (Note 1)
9 THI Clock High Time
50 — ns 4.5V VCC 5.5V
100 — ns 2.5V VCC < 4.5V
150 — ns 1.8V VCC < 2.5V
10 TLO Clock Low Time
50 — ns 4.5V VCC 5.5V
100 — ns 2.5V VCC < 4.5V
150 — ns 1.8V VCC < 2.5V
11 TCLD Clock Delay Time
50 — ns —
12 TCLE Clock Enable Time
50 — ns —
13 TV Output Valid from Clock
Low
50 ns 4.5V VCC 5.5V
100 ns 2.5V VCC < 4.5V
160 ns 1.8V VCC < 2.5V
14 THO Output Hold Time
0 — ns (Note 1)
15 TDIS Output Disable Time
— 40 ns 4.5V VCC 5.5V (Note 1)
— 80 ns 2.5V VCC 4.5V (Note 1)
— 160 ns 1.8V VCC 2.5V (Note 1)
16 THS HOLD Setup Time
20 — ns 4.5V VCC 5.5V
40 — ns 2.5V VCC < 4.5V
80 — ns 1.8V VCC < 2.5V
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from our web site:
www.microchip.com.
3: TWC begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
© 2007 Microchip Technology Inc.
DS21807D-page 3

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25XX160A/B
TABLE 1-2: AC CHARACTERISTICS (CONTINUED)
AC CHARACTERISTICS
Industrial (I): TAMB = -40°C to +85°C VCC = 1.8V to 5.5V
Automotive (E): TAMB = -40°C to +125°C VCC = 2.5V to 5.5V
Param.
No.
Sym.
Characteristic
Min. Max. Units
Test Conditions
17 THH HOLD Hold Time
20 — ns 4.5V VCC 5.5V
40 — ns 2.5V VCC < 4.5V
80 — ns 1.8V VCC < 2.5V
18 THZ HOLD Low to Output
High-Z
30 — ns 4.5V VCC 5.5V (Note 1)
60 — ns 2.5V VCC < 4.5V (Note 1)
160 — ns 1.8V VCC < 2.5V (Note 1)
19 THV HOLD High to Output
Valid
30 — ns 4.5V VCC 5.5V
60 — ns 2.5V VCC < 4.5V
160 — ns 1.8V VCC < 2.5V
20 TWC Internal Write Cycle Time —
5 ms (NOTE 3)
21 — Endurance
1M — E/W (NOTE 2)
Cycles
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from our web site:
www.microchip.com.
3: TWC begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
TABLE 1-3: AC TEST CONDITIONS
AC Waveform:
VLO = 0.2V
VHI = VCC - 0.2V
(Note 1)
VHI = 4.0V
(Note 2)
Timing Measurement Reference Level
Input
0.5 VCC
Output
0.5 VCC
Note 1: For VCC 4.0V
2: For VCC > 4.0V
DS21807D-page 4
© 2007 Microchip Technology Inc.

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25XX160A/B
FIGURE 1-1: HOLD TIMING
CS
16
SCK
SO n + 2
n+1
17
18
n
16 17
19
High-Impedance
n
SI
n+2
n+1
n
Don’t Care
5
n
HOLD
n-1
n-1
FIGURE 1-2: SERIAL INPUT TIMING
CS
2
Mode 1,1
SCK Mode 0,0
5
6
SI MSB in
SO
7
High-Impedance
FIGURE 1-3: SERIAL OUTPUT TIMING
CS
SCK
SO
SI
9 10
13
MSB out
Don’t Care
8
14
4
12
11
3
LSB in
3
15
ISB out
Mode 1,1
Mode 0,0
© 2007 Microchip Technology Inc.
DS21807D-page 5