WR08Xxxx.pdf 데이터시트 (총 3 페이지) - 파일 다운로드 WR08Xxxx 데이타시트 다운로드

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CHIP RESISTORS
WR08
WR06
WR04
2.0 0.1
1.6 0.1
1.0 0.05
1.25 0.1
0.8 0.1
0.5 0.05
0.4 0.2
0.3 0.1
0.2 0.1
0.4 0.2
0.3 0.2
0.25 0.1
0.5 0.15
0.45 0.15
0.35 0.05
Series No
Power rating
at 70
TCR
(ppm/ )
Max RCWV
(Note1)
Max Overload
Voltage
WR08
WR06
WR04
1/8W
1/10W
1/16W
100 100V
200 100V
100 50V
200 50V
200 50V
200 50V
200V
200V
100V
100V
100V
100V
Resistance
Tolerance( %)
1
5
1
5
1
2,5
Resistance
Range(Note2)
10 ~ 1M
1 ~ 10M
10 ~ 1M
1 ~ 10M
6.8 ~2.2M
6.8 ~ 2.2M
Standard
Res. Values
E-96
E-24
E-96
E-24
E-96
E-24
Working
Temperature
Range( )
-55 ~ 125

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PILKOR ELECTRONICS CO., LTD.
Test Item
DC Resistance
Specification
Chip Resistor
With the specified tolerance
Temperature
Coefficient of
Resistance
(TCR)
Short Time
Overload
(STOL)
Resistance to
Solder Heat
Solderability
WR08
WR06
WR04
100ppm/ for F product,
200ppm/ for J product.
-300~+500ppm/ for R 10
0 ~ 500ppm/ for R 10
200ppm/ for R 10
(2%+0.1 )
(1%+0.05 )
95% coverage min
Temperature
Cycle
WR08
WR06
WR04
(1%+0.1 )
(2%+0.1 )
Load Life in
Humidity
Load Life
Terminal
Strength
WR08
WR06
WR04
(1%)
WR04
(2%, 5%)
(3%+0.1 ) for 10 R 1M
(5%+0.1 ) for R 10
R 1M
(2%+0.1 )
(3%+0.1 )
WR08
WR06
WR04
(1%)
WR04
(2%, 5%)
(3%+0.1 ) for 10 R 1M
(5%+0.1 ) for R 10
R 1M
(2%+0.1 )
(3%+0.1 )
(1%+0.05 )
no evidence of mechanical demage
Jumper
Test Method
50m
lower
JIS C 5202 5.1
DC Resistance values measured at the test voltages specified below :
Resistance nominal
Test voltage
100 0.3V
1k 1V
10k 3V
100k 10V
1M 25V
10M 50V
- JIS C 5202 5.2 / IEC 115-1 4.8.4.2
Natural resistance change per temperature degree centigrade
TCR(ppm/
)
=
R2
R1
- R1
(t2 - t1)
X10 6
R1 : Resistance value at referance temperature
R2 : Resistance value at test temperature
t1 : Room temperature, t2 : Test temperature
50m
lower
JIS C 5202 5.5 / IEC 115-1 4.13
Permanent resistance change after a 5 second application of a
voltage 2.5 times RCWV or the maximum overload voltage specified
in the above list, whichever is less.
50m JIS C 5202 6.4 / IEC 115-1 4.18
lower With 260 5 for 10 1 second.
- JIS C 5202 6.5 / IEC 115-1 4.17
After immersing flux, dip in the 235 5 molten solder bath for
2 0.5 second.
50m
lower
JIS C 5202 7.4 / IEC 115-1 4.19
Resistance change after continuous 5cycle for duty cycle are specified
below :
Step Temperature
Time
1 -55 3
2 Normal
3 +125 3
4 Normal
30min
2~3min
30min
2~3min
50m
lower
JIS C 5202 7.9 / IEC 115-1 4.24.2
Resistance change after 1000+48/-0 hours, 1.5 hours ON , 0.5hour OFF ,
at RCWV in a humidity chamber controlled at 40 2 and 90%~95% relative humidity
50m
lower
JIS C 5202 7.10 / IEC 115-1 4.25.1
Permanent resistance change after 1000+48/-0 hours, operating at RCWV with
duty cycle of 1.5 hours ON , 0.5hour OFF , at 70 2 ambient.
50m
lower
JIS C 5202 6.1.4 / IEC 115-1 4.33
Bending test : at Y/X = 3mm/90mm, one time, 10 seconds.
Pulling test : 500 grams.

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CHIP RESISTORS
WR08
WR06
WR04
1.65 0.2
1.1 0.2
0.7 0.05
2.4 0.2
1.9 0.2
1.2 0.05
4.0 0.1
4.0 0.1
2.0 0.1
1.0MAX
1.0MAX
0.4 0.05
WR06,08
WR04
paper
paper
8mm 5,000
8mm 10,000