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ROUND TYPE LED LAMPS
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
www.DataSheet4U.com
LUR3331
DATA SHEET
DOC. NO : QW0905- LUR3331
REV. : A
DATE : 21 - Jun - 2005

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PART NO. LUR3331
Package Dimensions
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
www.DPaatagSehee1t/44U.com
5.0 5.9
7.6 8.6
1.5MAX
0.5
TYP
25.0MIN
2.54TYP
1.0MIN
Note : 1.All dimension are in millimeter tolerance is 0.25mm unless otherwise noted.
2.Specifications are subject to change without notice.
Directivity Radiation
0
-30 30
-60 60
100% 75% 50% 25% 0 25% 50% 75% 100%

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PART NO. LUR3331
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
www.DataSheet4U.com
Page 2/4
Absolute Maximum Ratings at Ta=25
Parameter
Forward Current
Peak Forward Current
Duty 1/10@10KHz
Power Dissipation
Reverse Current @5V
Operating Temperature
Storage Temperature
Soldering Temperature
Symbol
IF
IFP
PD
Ir
Topr
Tstg
Tsol
Ratings
UR
UNIT
40 mA
120 mA
120 mW
10 A
-40 ~ +85
-40 ~ +100
Max 260 for 5 sec Max
(2mm from body)
Typical Electrical & Optical Characteristics (Ta=25 )
PART NO MATERIAL
COLOR
Emitted
Lens
Peak
wave
length
Pnm
Spectral Forward
halfwidth voltage
nm @20mA(V)
Luminous
intensity
@20mA(mcd)
Viewing
angle
2 1/2
(deg)
Min. Max. Min. Typ.
LUR3331 GaAlAs
Red Red Transparent 660
20 1.5 2.4 1100 1800 20
Note : 1.The forward voltage data did not including 0.1V testing tolerance.
2. The luminous intensity data did not including 15% testing tolerance.

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PART NO. LUR3331
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
www.DataSheet4U.com
Page 3/4
Typical Electro-Optical Characteristics Curve
UR CHIP
Fig.1 Forward current vs. Forward Voltage
Fig.2 Relative Intensity vs. Forward Current
1000
100
10
1
01
1.0
2.0 3.0 4.0
Forward Voltage(V)
5.0
Fig.3 Forward Voltage vs. Temperature
1.2
1.1
1.0
0.9
0.8
-40 -20 0
20 40 60 80 100
Ambient Temperature( )
3.0
2.5
2.0
1.5
1.0
0.5
0.0
1
10 100
Forward Current(mA)
1000
Fig.4 Relative Intensity vs. Temperature
3.0
2.5
2.0
1.5
1.0
0.5
0.0
-40 -20 0 20 40 60 80 100
Ambient Temperature( )
Fig.5 Relative Intensity vs. Wavelength
1.0
0.5
0.0
600
650 700
Wavelength (nm)
750

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PART NO. LUR3331
Reliability Test:
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
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Page 4/4
Test Item
Operating Life Test
High Temperature
Storage Test
Low Temperature
Storage Test
Test Condition
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
1.Ta=105 5
2.t=1000 hrs (-24hrs, +72hrs)
1.Ta=-40 5
2.t=1000 hrs (-24hrs, +72hrs)
Description
This test is conducted for the purpose
of detemining the resisance of a part
in electrical and themal stressed.
The purpose of this is the resistance of
the device which is laid under ondition
of high temperature for hours.
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
Reference
Standard
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
MIL-STD-883:1008
JIS C 7021: B-10
JIS C 7021: B-12
High Temperature
High Humidity Test
Thermal Shock Test
1.Ta=65 5
2.RH=90 %~95 %
3.t=240hrs 2hrs
1.Ta=105 5 &-40
(10min) (10min)
2.total 10 cycles
5
Solder Resistance
Test
1.T.Sol=260 5
2.Dwell time= 10 1sec.
Solderability Test
1.T.Sol=230 5
2.Dwell time=5 1sec
The purpose of this test is the resistance
of the device under tropical for hous.
MIL-STD-202:103B
JIS C 7021: B-11
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
This test intended to see soldering well
performed or not.
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2