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Infrared Emitting Diode ChipMaker : Osram Opto Semiconductors
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www.DataSheet4U.com GaAlAs-Infrarot-Lumineszenzdiode (880 nm) GaAlAs Infrared Emitting Diode (880 nm) F 1047A F 1047B Vorläufige Daten / Preliminary Data Wesentliche Merkmale • Typ. Gesamtleistung: 22 mW @ 100 mA im TOPLED® Gehäuse • Chipgröße 300 x 300 µm2 • GaAlAs-LED mit sehr hohem Wirkungsgrad • Hohe Zuverlässigkeit • Hohe Impulsbelastbarkeit • Gute spektrale Anpassung an Si-Fotoempfänger • Vorderseitenmetallisierung: Aluminium Rückseitenmetallisierung: Goldlegierung • Lieferung: vereinzelt auf Folie Anwendungen • IR-Fernsteuerung von Fernseh-, Rundfunkund Videogeräten, Lichtdimmern • Gerätefernsteuerungen für Gleich- und Wechsellichtbetrieb • Lichtschranken bis 500 kHz • Sensorik • Diskrete Optokoppler I Features • Typ. total radiant power: 22 mW @ 100 mA in TOPLED® package. • Chipsize: 300 x 300 µm² • Very highly efficient GaAlAs LED • High reliability • High pulse handling capability • Good spectral match to silicon photodetectors • Frontside metallization: aluminum Backside metallization: gold alloy • Delivery: diced on foil Applications • IR remote control for hifi and TV sets, video tape recorder, dimmers • Remote control for steady and varying intensity • Light-reflection switches (max. 500 kHz) • Sensor technology • Discrete optocouplers Typ Type F 1047A F 1047B Bestellnummer Ordering Code Q67220-C1386 on request Beschreibung Description Infrarot emittierender Chip, Oberseite Kathodenanschluss Infrared emitting die, top side cathode connection Infrarot emittierender Chip, Oberseite Kathodenanschluss, Oberfläche aufgerauht. Infrared emitting die, top side cathode connection, surface frosted 2003-04-11 1 www.DataSheet4U.com F 1047A, F 1047B Elektrische Werte (TA = 25 °C) Electrical values1) (TA = 25 °C) Bezeichnung Parameter Emissionswellenlänge Peak wavelength IF = 10 mA Spektrale Bandbreite bei 50% von Imax, Spectral bandwidth at 50% of Imax IF = 10 mA Schaltzeiten, Ie von 10% auf 90% und von 90% auf 10%, bei IF = 100 mA, RL = 50 Ω Switching times, Ie from 10% to 90% and from 90% to 10%, IF = 100 mA, RL = 50 Ω Sperrspannung Reverse voltage IR = 1µA Durchlaβspannung Forward voltage IF = 100 mA Strahlungsleistung Radiant Power3) IF = 100 mA F1047A F1047B Photostrom (Spezifikationsparameter) Photocurrent (specified parameter) IF = 100 mA F1047A F1047B 1) Symbol Symbol min. λpeak Wert Value2) typ. 880 max. Einheit Unit nm ∆λ 100 nm tr, tf 0.5/0.4 µs VR 5 V VF 1.9 V Φe 12 14 Ie mW mW 0.50 0.65 a.u. a.u. Measurement limits describe actual settings and do not include measurement uncertainties. Each wafer and each fragment of a wafer is subject to final testing. The wafer or its pieces are individually attached on foils (ring). Sample chips are picked from each foil and placed on a special carrier for measurement purposes. The sampling density is one chip per 1cm². If a sample fails, the area around that sample is tested again by taking samples in fourfold density. If a sample fails in that measurement, an area of 0,25 cm² around each failed sample is marked by pen. All el. values are referenced to the vendor's measurement system (correlation to customer product(s) is required) Typical (refered to as typ.) data are defined as long-term production mean values and are only given for information. This is not a specified value Radiant power is measured on TO-18 header in integrating sphere. 2) 3) 2003-04-11 2 www.DataSheet4U.com F 1047A, F 1047B Mechanische Werte Mechanical values Bezeichnung Parameter Chipkantenlänge (x-Richtung) Length of chip edge (x-direction) Chipkantenlänge (y-Richtung) Length of chip edge (y-direction) Durchmesser des Wafers Diameter of the wafer Chiphöhe Die height Bondpaddurchmesser Diameter of bondpad Weitere Informationen Additional information2) Vorderseitenmetallisierung Metallization frontside Rückseitenmetallisierung Metallization backside Trennverfahren Dicing Verbindung... |
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